X-ray diffractometer

An X-ray diffractometer allows us to examine the structure of materials. X-ray light diffraction phenomena are used here. With this device, we can examine the structures and frameworks of target materials, e.g. crystal size, orientation, material composition. In quality control as well as in development, the materials can be better characterised in this way. In connection with the ultrasonic measuring technology, very precise and comprehensive quality statements about our materials are possible.
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